SMARTGIANT
Embedded Instrument Experts
英文(English) Solutions

Embedded Instrument Solution

Time:2017-04-27 :admin Reading:

DAQ Series
 





1st Generation: MCU+AD/DA+ IO








 2nd Generation: MCU+FPGA



 
ADC & DAC Module

  • Audio Test :24-bit audio ADC, 192 KHz SPS;24-bit audio DAC, 192 KHz

  • High Accuracy Measurement:32-bit ADC, 10 KHz SPS

  • General Application:12-bit ADC, 40MHz SPS;12-bit DAC, 125 MSPS;16-bit DAC, 800 MSPS(ongoing)
 
  • High Speed Measurement:16-bit ADC, 125MHz SPS;16-bit ADC, 200MHz SPS (ongoing

Support the  interface of LabView and Matlab


ICT Series



  • DMM:AC/DC current/voltage measurement;;Two-wire/four-wire resistance ;Transistor test.
  • LCR:Capacitance & inductance measurement 
  • Boundary Scan:Comply with the IEEE 1149.1 standard, support internal & interconnect testing of the chip.


Controller Series



 
PAC Controller
 
  • CPU: TI AM3358, ARM Cotex-A8, 720MHz
  • OS:  Linux3.2





Automation Controller
 
  • ARM +DSP+FPGA
  • OS: uC/OSIII